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US Patent Issued to Honeywell International on July 21 for "Detector and method for non-intrusively detecting electromagnetic interference" (Chinese Inventor)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,566, issued on July 21, was assigned to Honeywell International Inc. (Charlotte, N.C.). "Detector and method for non-intrusively detecting ... और पढ़ें


US Patent Issued to SAMSUNG ELECTRONICS on July 21 for "Electric field measuring apparatus and method of measuring electric field using the same" (South Korean Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,567, issued on July 21, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Electric field measuring apparatus and metho... और पढ़ें


US Patent Issued to ARTI ANALYTICS on July 21 for "Method and process of fault detection in power systems using machine learning feature extraction" (American, Bosnian, Herzegovinian Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,568, issued on July 21, was assigned to ARTI ANALYTICS INC. (Morgan Hill, Calif.). "Method and process of fault detection in power systems ... और पढ़ें


US Patent Issued to SK On on July 21 for "Secondary battery cell insulation test apparatus for simultaneous multiple-point insulation testing and method using the same" (South Korean Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,569, issued on July 21, was assigned to SK On Co. Ltd. (Seoul, South Korea). "Secondary battery cell insulation test apparatus for simultan... और पढ़ें


US Patent Issued to LS ELECTRIC on July 21 for "Insulation monitoring device and method for controlling insulation monitoring device" (South Korean Inventor)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,570, issued on July 21, was assigned to LS ELECTRIC Co. LTD. (Anyang-si, South Korea). "Insulation monitoring device and method for control... और पढ़ें


US Patent Issued to FUJI ELECTRIC on July 21 for "Test method" (Japanese Inventor)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,572, issued on July 21, was assigned to FUJI ELECTRIC Co. LTD. (Kanagawa, Japan). "Test method" was invented by Kenichi Ishii (Matsumoto-ci... और पढ़ें


US Patent Issued to Rohde & Schwarz on July 21 for "Measurement instrument and system for enhanced constellation diagrams and method thereof" (British Inventor)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,573, issued on July 21, was assigned to Rohde & Schwarz GmbH & Co. KG (Munich). "Measurement instrument and system for enhanced constellati... और पढ़ें


US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on July 21 for "Semiconductor testing apparatus and method for testing semiconductor structure" (Taiwanese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,574, issued on July 21, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan). "Semiconductor testing apparatus... और पढ़ें


US Patent Issued to Infineon Technologies on July 21 for "Controlled switching of stress voltages in lateral DMOS structures" (German, Austrian Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,575, issued on July 21, was assigned to Infineon Technologies AG (Neubiberg, Germany). "Controlled switching of stress voltages in lateral ... और पढ़ें


US Patent Issued to MATERIALS ANALYSIS TECHNOLOGY on July 21 for "Testing device and testing system" (Taiwanese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,576, issued on July 21, was assigned to MATERIALS ANALYSIS TECHNOLOGY INC. (Zhubei City, Taiwan). "Testing device and testing system" was i... और पढ़ें