ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,566, issued on July 21, was assigned to Honeywell International Inc. (Charlotte, N.C.). "Detector and method for non-intrusively detecting ... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,567, issued on July 21, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Electric field measuring apparatus and metho... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,568, issued on July 21, was assigned to ARTI ANALYTICS INC. (Morgan Hill, Calif.). "Method and process of fault detection in power systems ... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,569, issued on July 21, was assigned to SK On Co. Ltd. (Seoul, South Korea). "Secondary battery cell insulation test apparatus for simultan... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,570, issued on July 21, was assigned to LS ELECTRIC Co. LTD. (Anyang-si, South Korea). "Insulation monitoring device and method for control... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,572, issued on July 21, was assigned to FUJI ELECTRIC Co. LTD. (Kanagawa, Japan). "Test method" was invented by Kenichi Ishii (Matsumoto-ci... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,573, issued on July 21, was assigned to Rohde & Schwarz GmbH & Co. KG (Munich). "Measurement instrument and system for enhanced constellati... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,574, issued on July 21, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan). "Semiconductor testing apparatus... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,575, issued on July 21, was assigned to Infineon Technologies AG (Neubiberg, Germany). "Controlled switching of stress voltages in lateral ... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,576, issued on July 21, was assigned to MATERIALS ANALYSIS TECHNOLOGY INC. (Zhubei City, Taiwan). "Testing device and testing system" was i... और पढ़ें