ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,567, issued on July 21, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Electric field measuring apparatus and metho... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,568, issued on July 21, was assigned to ARTI ANALYTICS INC. (Morgan Hill, Calif.). "Method and process of fault detection in power systems ... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,569, issued on July 21, was assigned to SK On Co. Ltd. (Seoul, South Korea). "Secondary battery cell insulation test apparatus for simultan... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,570, issued on July 21, was assigned to LS ELECTRIC Co. LTD. (Anyang-si, South Korea). "Insulation monitoring device and method for control... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,572, issued on July 21, was assigned to FUJI ELECTRIC Co. LTD. (Kanagawa, Japan). "Test method" was invented by Kenichi Ishii (Matsumoto-ci... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,573, issued on July 21, was assigned to Rohde & Schwarz GmbH & Co. KG (Munich). "Measurement instrument and system for enhanced constellati... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,574, issued on July 21, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan). "Semiconductor testing apparatus... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,575, issued on July 21, was assigned to Infineon Technologies AG (Neubiberg, Germany). "Controlled switching of stress voltages in lateral ... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,576, issued on July 21, was assigned to MATERIALS ANALYSIS TECHNOLOGY INC. (Zhubei City, Taiwan). "Testing device and testing system" was i... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,577, issued on July 21, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Method, device, and system for detecting fus... Read More